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Experience precision and reliability with the Test Socket 40X40 P-1.25, designed for optimal performance in high-density IC testing applications. With a 40mm x 40mm body size and a 1.25mm pitch configuration, this socket is ideal for testing large-package devices such as high-pin-count processors, ASICs, and custom ICs. Engineered for durability and ease of integration, it offers stable contact resistance, superior thermal performance, and repeatable alignment—ensuring consistent test results in both engineering and production environments.

• Key Feature: 1.25mm pitch layout supports high pin-count ICs while maintaining excellent signal integrity and mechanical stability.

Enhance your semiconductor testing setup with the Test Socket 40X40 P-1.25—built for precision, speed, and scalability.