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Achieve exceptional testing performance with the Fujim Test Socket, engineered for high-reliability semiconductor and IC testing. Known for its precision alignment, robust contact design, and long lifecycle, the Fujim Test Socket supports a wide range of packages including BGA, QFN, and LGA. Ideal for both engineering validation and high-volume production, this socket delivers consistent electrical performance, minimal signal loss, and fast setup—making it a trusted choice for test engineers worldwide.

• Key Feature: Precision contact design ensures low contact resistance and high signal integrity, ideal for high-speed and high-frequency device testing.

Upgrade your testing capabilities with the Fujim Test Socket—where performance meets reliability.