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Optimize your testing process with the Test Socket 1932LD, designed specifically for high-performance applications requiring precise and reliable connections. Supporting a 1932-pin LGA (Land Grid Array) package, this socket ensures stable electrical contact and superior signal integrity for advanced semiconductor devices. Built for both engineering and high-volume production testing, the Test Socket 1932LD is engineered for durability, fast setup, and minimal downtime, making it an essential component for any testing environment where accuracy is crucial.

• Key Feature: Supports 1932-pin LGA packages with excellent contact resistance, providing high-speed, high-accuracy testing for large-scale ICs.

Enhance your testing capabilities with the Test Socket 1932LD, where performance, precision, and efficiency meet.